SIPKÁS, V.; BOGNÁR, G. Testing accelerated life data of micro switches. Design of Machines and Structures, [S. l.], v. 9, n. 2, p. 44–50, 2019. DOI: 10.32972/dms.2019.014. Disponível em: https://ojs.uni-miskolc.hu/index.php/dms/article/view/5049. Acesso em: 15 nov. 2026.