Testing accelerated life data of micro switches
DOI:
https://doi.org/10.32972/dms.2019.014Keywords:
Taguchi method, thermal camera, micro switches, accelerated life testing, switching cycle, orthogonal arraysAbstract
The aim of this paper is to introduce a testing method for accelerated lifetime testing applicable for micro switches. To predict the lifetime the operating environment in the test device is designed to accelerate the switches’ failure. The design of experiments is prepared with using the Taguchi method for different productions of micro switches applying different switching speed and different humidity values in the workbench.
References
Veličković, S., Stojanović, B., Babić, M., Vencl, A., Bobić, I., Vadászné Bognár, G., Vučetić, F. (2019). Parametric optimazation of the aluminium nanocompozites wear rate. Journal of the Brazilian Society of Machanical Sciences and Engineering, 41 (1), pp. 1-10. https://doi.org/10.1007/s40430-018-1531-8
Sipkás Vivien, Vadászné dr. Bognár Gabriella (2019). Mikrokapcsolók élettartam vizsgálatának kérdései. XXVII. Nemzetközi Gépészeti Konferencia, pp. 476-479, ISSN 2068-1267.
Sipkás, V., Bognár, G. (2018). Failure Prediction Models for Accelerated Life Tests. WSEAS Transactions on Circuits and Systems, vol. 17, pp.173-179. EISSN: 2224-266X
Sipkás, V., Bognár, G. (2018). Micro Switch Failure Analysis, Design of Machines and Structures. A Publication of the University of Miskolc, vol. 8, no. 1, pp. 29-35. ISSN 1785-6892. https://doi.org/10.32972/dms.2018.003
Sipkás Vivien, Vadászné dr. Bognár Gabriella (2019). Mikrokapcsolók meghibásodási analízise. Doktoranduszok Fóruma, pp. 91-95. ISBN 978-963-358-194-0.
Sipkás Vivien, Vadászné dr. Bognár Gabriella (2018). Mikrokapcsolók Weibull- eloszlásán alapuló gyorsított élettartam vizsgálatok. Doktoranduszok Fóruma, pp. 105-110, ISBN 978-963-358-166-7.
Meeker, W. Q., Escobar, L. A. (1998). Statistical Methods for Reliability Data. Wiley-Interscience Publication-John Wiley& Sons, INC, ISBN 978-0-471-14328.
