Failure data evaluation for structural elements

Abstract

The aim of this paper is to systematically analyze test results performed on the lifetime of micro switches and to give a characterization of the lifetime of each product with changes in mean, standard deviation. Failure data are compared using the Weibull distribution We summarize the factorial experimental design of the tests and the experimental models of the response function. Our goal is to develop a life prediction method and to predict the reliability of products in engineering practice.