Analysis of the failure results of micro switches

Abstract

The aim of this paper is to present the results achieved with the support of the EFOP Youth and Renewable University - Innovative City of Knowledge - the institutional development project of the University of Miskolc for intelligent specialization. The failure data of the tested micro switches are analyzed by accelerated life testing method. During the analysis of the test results the parameters of the Weibull distribution are determined, and we investigate the effect of the failure and malfunction processes on the life time of the micro switches.